Leica DVM6 Digital Microscope

Price Excludes VAT & Delivery

The DVM6 digital microscope solution is fast, reliable, and easy to use – no matter if you work in quality assurance, failure analysis, research and development, or forensics.

From the big picture to fine details in an instant. Even an objective change does not interrupt your workflow. The DVM6 works straightforward and saves you time inspecting various samples. This solution enables users to start working with minimal training requirements.

Description

Leica DVM6 Digital Microscope

Maximum flexibility for inspecting a variety of samples.

Offering maximum flexibility for inspecting a variety of samples, the Leica DVM6 Digital Microscope is ideal for quality control, failure analysis and inspection tasks.

  • 16:1 zoom range
  • Three Plan Apochromat objectives: high magnification, mid magnification and low magnification
  • View down to 0.4 micrometres
  • Continuous autofocus
  • View samples up to 340mm in height
  • Image data automatically stored
  • Modular design
  • Tilting angles
  • Featuring a range of different illumination techniques

Investigate a wide range of samples

The DVM6’s 16:1 zoom range and three Plan Apochromat objectives at low, mid and high magnifications enables the user to view both macro images and micro images down to 0.4 micrometres.

 

Continuous autofocus for viewing samples with varying height parts

Maintain focus whilst navigating your sample with the continuous autofocus function. This is super-handy for viewing samples with varying heights.

 

Modular design

The Leica DVM6 Digital Microscope’s modular design creates an adaptable setup to best match your individual requirements. View samples up to 340mm in height with the optional microscope stands.

 

See more detail on your sample

Featuring a range of different illumination techniques, the DVM6 digital microscope is capable of viewing more detail on your sample. Illumination options include:

  • a ring light for viewing samples with a textured surface
  • coaxial illumination for viewing flat, reflective samples
  • transmitted light illumination for viewing hard-to-see regions, such as holes
  • diffuser adapter to minimise glare on reflective surfaces e.g. polished metal
  • polariser adapter to view different material properties and identify contamination

 

Reproducible images

Image data is automatically stored when capturing images, enabling you to reproduce the image and obtain reliable results during failure analysis and R&D.

 

Applications:

  • Failure-analysis
  • R&D
  • Quality testing
  • Inspection tasks
  • Earth science
  • Also suitable for many other applications

Resources:

  • Download a brochure on the Leica DVM6 digital microscope here
  • Request a quotation by emailing sales@gtvision.co.uk
  • Request a demonstration of the microscope by emailing sales@gtvision.co.uk
  • View GT Vision’s full range of materials and industrial inspection digital microscopes here.
  • View GT Vision’s returns policy here.
SHIPPING

Please contact us for delivery times for this microscope

Please phone us on +44 (0)1284 789697 or email us for current delivery times.

REQUEST A QUOTATION

Request a quotation for bulk orders by emailing sales@gtvision.co.uk

QUESTIONS

If you have any questions about this model, please email sales@gtvision.co.uk

WHY BUY FROM GT VISION?

– Because we supply microscopes from a wide variety of brands and manufacturers, we can offer expert advice on which microscope model is best suited for your application and budget without bias towards a particular brand.

– We provide tailor-built systems to match your specific requirements and budget.

– Expert support pre and post purchase.

– For a full system solution, we also supply microscope cameras and software (again from a wide choice of brands).

– We can retro-fit cameras and illumination systems, including modern LED fluorescence illuminators, to most models and ages of existing microscopes. We also have in-house engineering capabilities for particularly unique requirements.